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S. Hamdioui

Prof.dr.

 https://orcid.org/0000-0002-8961-0387
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  • 2021

    Fan-out of 2 Triangle Shape Spin Wave Logic Gates

    Mahmoud, A., Adelmann, C., Vanderveken, F., Cotofana, S., Ciubotaru, F. & Hamdioui, S., 2021, 2021 Design, Automation & Test in Europe Conference & Exhibition (DATE). Piscataway: IEEE, p. 948-953 6 p. 9474089

    Research output: Chapter in Book/Conference proceedings/Edited volume › Conference contribution › Scientific › peer-review

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    4 Citations (Scopus)
    22 Downloads (Pure)

  • Flip Flop Weighting: A technique for estimation of safety metrics in Automotive Designs

    Augusto da Silva, F., Bagbaba, A. C., Hamdioui, S. & Sauer, C., 2021, 2021 IEEE 27th International Symposium on On-Line Testing and Robust System Design (IOLTS). Danvers: IEEE, p. 1-7 7 p. 9486697

    Research output: Chapter in Book/Conference proceedings/Edited volume › Conference contribution › Scientific › peer-review

    1 Citation (Scopus)

  • GRINCH: A Cache Attack against GIFT Lightweight Cipher

    Reinbrecht, C., Aljuffri, A., Hamdioui, S., Taouil, M. & Sepulveda, J., 2021, 2021 Design, Automation & Test in Europe Conference & Exhibition (DATE). Piscataway: IEEE, p. 549-554 6 p. 9474201

    Research output: Chapter in Book/Conference proceedings/Edited volume › Conference contribution › Scientific › peer-review

    3 Citations (Scopus)

  • Impact of Data Pre-Processing Techniques on Deep Learning Based Power Attacks

    Aljuffri, A. A. M., Reinbrecht, C., Hamdioui, S. & Taouil, M., 2021, 2021 16th International Conference on Design & Technology of Integrated Systems in Nanoscale Era (DTIS). 6 p.

    Research output: Chapter in Book/Conference proceedings/Edited volume › Conference contribution › Scientific › peer-review

    1 Citation (Scopus)

  • Improving the Detection of Undefined State Faults in FinFET SRAMs

    Cardoso Medeiros, G., Fieback, M., Copetti, T., Gebregiorgis, A. B., Taouil, M., Bolzani Poehls, L. M. & Hamdioui, S., 2021, International Conference on Design & Technology of Integrated System in Nanoscale Era (DTIS). 16th ed. IEEE, 6 p.

    Research output: Chapter in Book/Conference proceedings/Edited volume › Conference contribution › Scientific › peer-review

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    48 Downloads (Pure)

  • Intermittent Undefined State Fault in RRAMs

    Fieback, M., Cardoso Medeiros, G., Gebregiorgis, A., Aziza, H., Taouil, M. & Hamdioui, S., 2021, 2021 IEEE European Test Symposium (ETS). Danvers: IEEE, 6 p. 9465401

    Research output: Chapter in Book/Conference proceedings/Edited volume › Conference contribution › Scientific › peer-review

    Open Access
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    10 Citations (Scopus)
    36 Downloads (Pure)

  • LightRoAD: Lightweight Rowhammer Attack Detector

    Taouil, M., Reinbrecht, C., Hamdioui, S. & Sepulveda, J., 2021, Proceedings - 2021 IEEE Computer Society Annual Symposium on VLSI, ISVLSI 2021: Proceedings. Ceballos, C. (ed.). Piscataway: IEEE, p. 362-367 6 p. 9516766. (Proceedings of IEEE Computer Society Annual Symposium on VLSI, ISVLSI; vol. 2021-July).

    Research output: Chapter in Book/Conference proceedings/Edited volume › Conference contribution › Scientific › peer-review

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    3 Citations (Scopus)
    83 Downloads (Pure)

  • Low-power memristor-based computing for edge-AI applications

    Singh, A., Diware, S., Gebregiorgis, A., Bishnoi, R., Catthoor, F., Joshi, R. V. & Hamdioui, S., 2021, 2021 IEEE International Symposium on Circuits and Systems (ISCAS). Piscataway: IEEE, 5 p. 9401226. (2021 IEEE INTERNATIONAL SYMPOSIUM ON CIRCUITS AND SYSTEMS (ISCAS)).

    Research output: Chapter in Book/Conference proceedings/Edited volume › Conference contribution › Scientific › peer-review

    9 Citations (Scopus)

  • Modeling Soft-Error Reliability Under Variability

    Balakrishnan, A., Cardoso Medeiros, G., Cem Gursoy, C., Hamdioui, S., Jenihhin, M. & Alexandrescu, D., 2021, 34th IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT). IEEE, p. 1-6 6 p.

    Research output: Chapter in Book/Conference proceedings/Edited volume › Conference contribution › Scientific › peer-review

    Open Access
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    1 Citation (Scopus)
    69 Downloads (Pure)

  • Multi-bit blinding: A countermeasure for RSA against side channel attacks

    Aljuffri, A., Reinbrecht, C., Hamdioui, S. & Taouil, M., 2021, 2021 IEEE 39th VLSI Test Symposium (VTS). Piscataway: IEEE, 6 p. 9441035

    Research output: Chapter in Book/Conference proceedings/Edited volume › Conference contribution › Scientific › peer-review

    2 Citations (Scopus)

  • Perspectives on Emerging Computation-in-Memory Paradigms

    Rai, S., Liu, M., Gebregiorgis, A., Bhattacharjee, D., Chakrabarty, K., Hamdioui, S., Chattopadhyay, A., Trommer, J. & Kumar, A., 2021, 2021 Design, Automation & Test in Europe Conference & Exhibition (DATE). Piscataway: IEEE, p. 1925-1934 10 p. 9473976

    Research output: Chapter in Book/Conference proceedings/Edited volume › Conference contribution › Scientific › peer-review

    5 Citations (Scopus)

  • Power Side Channel Attacks: Where Are We Standing?

    Taouil, M., Aljuffri, A. A. M. & Hamdioui, S., 2021, 2021 16th International Conference on Design & Technology of Integrated Systems in Nanoscale Era (DTIS). IEEE, 6 p.

    Research output: Chapter in Book/Conference proceedings/Edited volume › Conference contribution › Scientific › peer-review

    10 Citations (Scopus)

  • Protecting IoT Devices through a Hardware-driven Memory Verification

    Köylü, T. Ç., Okkerman, H., Reinbrecht, C. R. W., Hamdioui, S. & Taouil, M., 2021, 2021 24th Euromicro Conference on Digital System Design (DSD): Proceedings. O'Conner, L. (ed.). Piscataway: IEEE, p. 115-122 8 p. 9556394

    Research output: Chapter in Book/Conference proceedings/Edited volume › Conference contribution › Scientific › peer-review

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    107 Downloads (Pure)

  • Revealing the Secrets of Spiking Neural Networks: The Case of Izhikevich Neuron

    Caetano Garaffa, L., Aljuffri, A., Reinbrecht, C., Hamdioui, S., Taouil, M. & Sepulveda, J., 2021, 2021 24th Euromicro Conference on Digital System Design (DSD): Proceedings. O'Conner, L. (ed.). Piscataway: IEEE, p. 514-518 5 p. 9556441

    Research output: Chapter in Book/Conference proceedings/Edited volume › Conference contribution › Scientific › peer-review

    Open Access
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    7 Citations (Scopus)
    201 Downloads (Pure)

  • Spin Wave Based 4-2 Compressor

    Mahmoud, A., Vanderveken, F., Ciubotaru, F., Adelmann, C., Cotofana, S. & Hamdioui, S., 2021, 2021 28th IEEE International Conference on Electronics, Circuits, and Systems, ICECS 2021 - Proceedings. Piscataway: IEEE, p. 1-4 4 p. 9665499. (2021 28th IEEE International Conference on Electronics, Circuits, and Systems, ICECS 2021 - Proceedings).

    Research output: Chapter in Book/Conference proceedings/Edited volume › Conference contribution › Scientific › peer-review

    Open Access
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    2 Citations (Scopus)
    28 Downloads (Pure)

  • Spin wave based full adder

    Mahmoud, A., Vanderveken, F., Ciubotaru, F., Adelmann, C., Cotofana, S. & Hamdioui, S., 2021, 2021 IEEE International Symposium on Circuits and Systems (ISCAS). Piscataway: IEEE, 5 p. 9401524. (2021 IEEE INTERNATIONAL SYMPOSIUM ON CIRCUITS AND SYSTEMS (ISCAS)).

    Research output: Chapter in Book/Conference proceedings/Edited volume › Conference contribution › Scientific › peer-review

    Open Access
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    6 Citations (Scopus)
    62 Downloads (Pure)

  • Tile Architecture and Hardware Implementation for Computation-in-Memory

    Zahedi, M., van Duijnen, R., Wong, S. & Hamdioui, S., 2021, Proceedings - 2021 IEEE Computer Society Annual Symposium on VLSI, ISVLSI 2021: Proceedings. Ceballos, C. (ed.). Piscataway: IEEE, p. 108-113 6 p. 9516737. (Proceedings of IEEE Computer Society Annual Symposium on VLSI, ISVLSI; vol. 2021-July).

    Research output: Chapter in Book/Conference proceedings/Edited volume › Conference contribution › Scientific › peer-review

    5 Citations (Scopus)

  • Towards Reliable In-Memory Computing: From Emerging Devices to Post-von-Neumann Architectures

    Amrouch, H., Du, N., Gebregiorgis, A., Hamdioui, S. & Polian, I., 2021, Proceedings of the 2021 IFIP/IEEE International Conference on Very Large Scale Integration, VLSI-SoC 2021: Proceedings. IEEE, p. 1-6 6 p. 9606966. (IEEE/IFIP International Conference on VLSI and System-on-Chip, VLSI-SoC; vol. 2021-October).

    Research output: Chapter in Book/Conference proceedings/Edited volume › Conference contribution › Scientific › peer-review

    6 Citations (Scopus)

  • Unbalanced Bit-slicing Scheme for Accurate Memristor-based Neural Network Architecture

    Diware, S., Gebregiorgis, A., Joshi, R. V., Hamdioui, S. & Bishnoi, R., 2021, 2021 IEEE 3rd International Conference on Artificial Intelligence Circuits and Systems (AICAS). IEEE, p. 1-4 4 p. 9458443

    Research output: Chapter in Book/Conference proceedings/Edited volume › Conference contribution › Scientific › peer-review

    Open Access
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    7 Citations (Scopus)
    163 Downloads (Pure)
  • 2020

    2-output spin wave programmable logic gate

    Mahmoud, A., Vanderveken, F., Adelmann, C., Ciubotaru, F., Cotofana, S. & Hamdioui, S., 2020, 2020 IEEE Computer Society Annual Symposium on VLSI (ISVLSI): Proceedings. O'Conner, L. (ed.). Piscataway: IEEE, p. 60-65 6 p. 9155012. (2020 IEEE COMPUTER SOCIETY ANNUAL SYMPOSIUM ON VLSI (ISVLSI 2020)).

    Research output: Chapter in Book/Conference proceedings/Edited volume › Conference contribution › Scientific › peer-review

    Open Access
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    11 Citations (Scopus)
    127 Downloads (Pure)

  • 4-output Programmable Spin Wave Logic Gate

    Mahmoud, A., Vanderveken, F., Adelmann, C., Ciubotaru, F., Hamdioui, S. & Cotofana, S., 2020, 2020 IEEE 38th International Conference on Computer Design (ICCD): Proceedings. Guerrero, J. (ed.). Piscataway: IEEE, p. 332-335 4 p. 9283535. (2020 IEEE 38TH INTERNATIONAL CONFERENCE ON COMPUTER DESIGN (ICCD 2020)).

    Research output: Chapter in Book/Conference proceedings/Edited volume › Conference contribution › Scientific › peer-review

    Open Access
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    9 Citations (Scopus)
    76 Downloads (Pure)

  • A DFT Scheme to Improve Coverage of Hard-to-Detect Faults in FinFET SRAMs

    Medeiros, G. C., Cem Gursoy, C., Wu, L., Fieback, M., Jenihhin, M., Taouil, M. & Hamdioui, S., 2020, Proceedings of the 2020 Design, Automation and Test in Europe Conference and Exhibition, DATE 2020. Di Natale, G., Bolchini, C. & Vatajelu, E-I. (eds.). Institute of Electrical and Electronics Engineers (IEEE), p. 792-797 6 p. 9116278. (Proceedings of the 2020 Design, Automation and Test in Europe Conference and Exhibition, DATE 2020).

    Research output: Chapter in Book/Conference proceedings/Edited volume › Conference contribution › Scientific › peer-review

    Open Access
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    5 Citations (Scopus)
    41 Downloads (Pure)

  • A Security Verification Template to Assess Cache Architecture Vulnerabilities

    Ghasempouri, T., Raik, J., Paul, K., Reinbrecht, C., Hamdioui, S. & Taouil, M., 2020, 2020 23rd International Symposium on Design and Diagnostics of Electronic Circuits and Systems (DDECS): Proceedings. IEEE, p. 1-6 6 p. 9095707

    Research output: Chapter in Book/Conference proceedings/Edited volume › Conference contribution › Scientific › peer-review

    Open Access
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    5 Citations (Scopus)
    103 Downloads (Pure)

  • Combining Fault Analysis Technologies for ISO26262 Functional Safety Verification

    Augusto da Silva, F., Bagbaba, A. C., Hamdioui, S. & Sauer, C., 2020, Proceedings - 2019 IEEE 28th Asian Test Symposium, ATS 2019. Bilof, R. S. (ed.). Piscataway: IEEE, Vol. 2019-December. p. 129-134 6 p. 8949396. (2019 IEEE 28TH ASIAN TEST SYMPOSIUM (ATS)).

    Research output: Chapter in Book/Conference proceedings/Edited volume › Conference contribution › Scientific › peer-review

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    9 Citations (Scopus)
    555 Downloads (Pure)

  • Determined-Safe Faults Identification: A step towards ISO26262 hardware compliant designs

    Augusto da Silva, F., Bagbaba, A. C., Sartoni, S., Cantoro, R., Reorda, M. S., Hamdioui, S. & Sauer, C., 2020, 2020 IEEE European Test Symposium (ETS): Proceedings. IEEE, p. 1-6 6 p.

    Research output: Chapter in Book/Conference proceedings/Edited volume › Conference contribution › Scientific › peer-review

    Open Access
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    8 Citations (Scopus)
    203 Downloads (Pure)

  • Device-Aware Test for Emerging Memories: Enabling Your Test Program for DPPB Level

    Wu, L., Fieback, M., Taouil, M. & Hamdioui, S., 2020, 2020 IEEE European Test Symposium (ETS). Institute of Electrical and Electronics Engineers (IEEE), p. 1-2 2 p.

    Research output: Chapter in Book/Conference proceedings/Edited volume › Conference contribution › Scientific › peer-review

    Open Access
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    1 Citation (Scopus)
    93 Downloads (Pure)

  • Efficient organization of digital periphery to support integer datatype for memristor-based cim

    Zahedi, M., Mayahinia, M., Abu Lebdeh, M., Wong, S. & Hamdioui, S., 2020, 2020 IEEE Computer Society Annual Symposium on VLSI (ISVLSI): Proceedings. O'Conner, L. (ed.). Piscataway: IEEE, p. 216-221 6 p. 9154923. (2020 IEEE COMPUTER SOCIETY ANNUAL SYMPOSIUM ON VLSI (ISVLSI 2020)).

    Research output: Chapter in Book/Conference proceedings/Edited volume › Conference contribution › Scientific › peer-review

    Open Access
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    9 Citations (Scopus)
    152 Downloads (Pure)

  • ESRAM Reliability: Why is it still not optimally solved?

    Kraak, D., Taouil, M., Hamdioui, S., Weckx, P., Cosemans, S. & Catthoor, F., 2020, Proceedings - 2020 15th IEEE International Conference on Design and Technology of Integrated Systems in Nanoscale Era, DTIS 2020. Piscataway, NJ, USA: Institute of Electrical and Electronics Engineers (IEEE), 6 p. 9081145

    Research output: Chapter in Book/Conference proceedings/Edited volume › Conference contribution › Scientific › peer-review

    1 Citation (Scopus)

  • Evaluating the Impact of Ionizing Particles on FinFET -based SRAMs with Weak Resistive Defects

    Copetti, T., Medeiros, G. C., Taouil, M., Hamdioui, S., Poehls, L. B. & Balen, T., 1 Mar 2020, 21st IEEE Latin-American Test Symposium, LATS 2020. Institute of Electrical and Electronics Engineers (IEEE), 6 p. 9093667

    Research output: Chapter in Book/Conference proceedings/Edited volume › Conference contribution › Scientific › peer-review

    Open Access
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    6 Citations (Scopus)
    56 Downloads (Pure)

  • Exploiting Approximate Computing for implementing Low Cost Fault Tolerance Mechanisms

    Bosio, A., O'Connor, I., Rodrigues, G. S., Lima, F. K. & Hamdioui, S., 1 Apr 2020, Proceedings - 2020 15th IEEE International Conference on Design and Technology of Integrated Systems in Nanoscale Era, DTIS 2020. Institute of Electrical and Electronics Engineers (IEEE), 2 p. 9081268

    Research output: Chapter in Book/Conference proceedings/Edited volume › Conference contribution › Scientific › peer-review

    Open Access
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    3 Citations (Scopus)
    129 Downloads (Pure)

  • G-PUF: An Intrinsic PUF Based on GPU Error Signatures

    Forlin, B., Husemann, R., Carro, L., Reinbrecht, C., Hamdioui, S. & Taouil, M., 2020, 2020 IEEE European Test Symposium (ETS): Proceedings. IEEE, p. 1-2 2 p. 9131562

    Research output: Chapter in Book/Conference proceedings/Edited volume › Conference contribution › Scientific › peer-review

    2 Citations (Scopus)

  • Guard-NoC: A protection against side-channel attacks for MPSoCs

    Reinbrecht, C., Aljuffri, A., Hamdioui, S., Taouil, M., Forlin, B. E. & Sepulveda, J., 2020, 2020 IEEE Computer Society Annual Symposium on VLSI (ISVLSI): Proceedings. O'Conner, L. (ed.). Pisacataway: IEEE, p. 536-541 6 p. 9154989. (2020 IEEE COMPUTER SOCIETY ANNUAL SYMPOSIUM ON VLSI (ISVLSI 2020)).

    Research output: Chapter in Book/Conference proceedings/Edited volume › Conference contribution › Scientific › peer-review

    Open Access
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    7 Citations (Scopus)
    136 Downloads (Pure)

  • Impact of Magnetic Coupling and Density on STT-MRAM Performance

    Wu, L., Rao, S., Taouil, M., Marinissen, E. J., Kar, G. S. & Hamdioui, S., 2020, Proceedings of the 2020 Design, Automation and Test in Europe Conference and Exhibition, DATE 2020. Di Natale, G., Bolchini, C. & Vatajelu, E-I. (eds.). Grenoble, France: IEEE, p. 1211-1216 6 p. 9116444

    Research output: Chapter in Book/Conference proceedings/Edited volume › Conference contribution › Scientific › peer-review

    Open Access
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    11 Citations (Scopus)
    47 Downloads (Pure)

  • LiD-CAT: A Lightweight Detector for Cache ATtacks

    Reinbrecht, C., Hamdioui, S., Taouil, M., Niazmand, B., Ghasempouri, T., Raik, J. & Sepulveda, J., 2020, 2020 IEEE European Test Symposium (ETS): Proceedings. IEEE, p. 1-6 6 p. 9131603

    Research output: Chapter in Book/Conference proceedings/Edited volume › Conference contribution › Scientific › peer-review

    Open Access
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    7 Citations (Scopus)
    112 Downloads (Pure)

  • Mitigation of Sense Amplifier Degradation Using Skewed Design

    Kraak, D., Taouil, M., Hamdioui, S., Weckx, P., Cosemans, S. & Catthoor, F., Mar 2020, Proceedings of the 2020 Design, Automation and Test in Europe Conference and Exhibition, DATE 2020. Di Natale, G., Bolchini, C. & Vatajelu, E-I. (eds.). Institute of Electrical and Electronics Engineers (IEEE), p. 1614-1617 4 p. 9116532. (Proceedings of the 2020 Design, Automation and Test in Europe Conference and Exhibition, DATE 2020).

    Research output: Chapter in Book/Conference proceedings/Edited volume › Conference contribution › Scientific › peer-review

    2 Citations (Scopus)

  • Modeling Static Noise Margin for FinFET based SRAM PUFs

    Masoumian, S., Selimis, G., Maes, R., Schrijen, G-J., Hamdioui, S. & Taouil, M., 2020, 2020 IEEE European Test Symposium (ETS): Proceedings. IEEE, p. 1-6 6 p. 9131583

    Research output: Chapter in Book/Conference proceedings/Edited volume › Conference contribution › Scientific › peer-review

    Open Access
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    5 Citations (Scopus)
    241 Downloads (Pure)

  • N-bit Data Parallel Spin Wave Logic Gate

    Mahmoud, A. N. N., Vanderveken, F., Ciubotaru, F., Adelmann, C., Cotofana, S. & Hamdioui, S., 2020, 2020 Design, Automation & Test in Europe Conference & Exhibition (DATE): Proceedings. Di Natale, G., Bolchini, C. & Vatajelu, E-I. (eds.). IEEE, p. 642-645 4 p. 9116368

    Research output: Chapter in Book/Conference proceedings/Edited volume › Conference contribution › Scientific › peer-review

    Open Access
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    11 Citations (Scopus)
    60 Downloads (Pure)

  • On the Analysis of Real-time Operating System Reliability in Embedded Systems

    Mamone, D., Bosio, A., Savino, A., Hamdioui, S. & Rebaudengo, M., 2020, 33rd IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems, DFT 2020: Proceedings. Dilillo, L., Psarakis, M. & Siddiqua, T. (eds.). IEEE, p. 1-6 6 p. 9250861. (33rd IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems, DFT 2020).

    Research output: Chapter in Book/Conference proceedings/Edited volume › Conference contribution › Scientific › peer-review

    Open Access
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    8 Citations (Scopus)
    258 Downloads (Pure)

  • RNN-based Detection of Fault Attacks on RSA

    Köylü, T. C., Reinbrecht, C. R. W., Hamdioui, S. & Taouil, M., 2020, 2020 IEEE International Symposium on Circuits and Systems (ISCAS). Piscataway: IEEE, p. 1-5 5 p.

    Research output: Chapter in Book/Conference proceedings/Edited volume › Conference contribution › Scientific › peer-review

    Open Access
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    151 Downloads (Pure)

  • S-NET: A Confusion Based Countermeasure Against Power Attacks for SBOX

    Aljuffri, A., Venkatachalam, P., Reinbrecht, C., Hamdioui, S. & Taouil, M., 2020, Embedded Computer Systems: Architectures, Modeling, and Simulation - 20th International Conference, SAMOS 2020, Proceedings. Orailoglu, A., Jung, M. & Reichenbach, M. (eds.). Springer, p. 295-307 13 p. (Lecture Notes in Computer Science (including subseries Lecture Notes in Artificial Intelligence and Lecture Notes in Bioinformatics); vol. 12471 LNCS).

    Research output: Chapter in Book/Conference proceedings/Edited volume › Conference contribution › Scientific › peer-review

    2 Citations (Scopus)

  • Special Session: AutoSoC: A Suite of Open-Source Automotive SoC Benchmarks

    Augusto da Silva, F., Bagbaba, A. C., Ruospo, A., Mariani, R., Kanawati, G., Reorda, M. S., Jenihhin, M., Hamdioui, S. & Sauer, C., 2020, 2020 IEEE 38th VLSI Test Symposium (VTS): Proceedings. IEEE, p. 1-9 9 p.

    Research output: Chapter in Book/Conference proceedings/Edited volume › Conference contribution › Scientific › peer-review

    Open Access
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    5 Citations (Scopus)
    434 Downloads (Pure)

  • Special Session - Emerging Memristor Based Memory and CIM Architecture: Test, Repair and Yield Analysis

    Bishnoi, R., Wu, L., Fieback, M., Munch, C., Nair, S. M., Tahoori, M., Wang, Y., Li, H. & Hamdioui, S., 1 Apr 2020, Proceedings - 2020 IEEE 38th VLSI Test Symposium, VTS 2020. IEEE, Vol. 2020-April. 9107595. (Proceedings of the IEEE VLSI Test Symposium; vol. 2020-April).

    Research output: Chapter in Book/Conference proceedings/Edited volume › Conference contribution › Scientific › peer-review

    9 Citations (Scopus)

  • Testing Scouting Logic-Based Computation-in-Memory Architectures

    Fieback, M., Nagarajan, S., Bishnoi, R., Tahoori, M., Taouil, M. & Hamdioui, S., 2020, Proceedings - 2020 IEEE European Test Symposium, ETS 2020: Proceedings. IEEE, p. 1-6 6 p. 9131604. (Proceedings of the European Test Workshop; vol. 2020-May).

    Research output: Chapter in Book/Conference proceedings/Edited volume › Conference contribution › Scientific › peer-review

    12 Citations (Scopus)

  • The Power of Computation-in-Memory Based on Memristive Devices

    Yu, J., Abu Lebdeh, M., Du Nguyen, H. A., Taouil, M. & Hamdioui, S., 15 Jan 2020, 25th Asia and South Pacific Design Automation Conference (ASP-DAC). IEEE, p. 385-392 8 p. 9045162

    Research output: Chapter in Book/Conference proceedings/Edited volume › Conference contribution › Scientific › peer-review

    Open Access
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    5 Citations (Scopus)
    136 Downloads (Pure)

  • Yield Estimation of a Memristive Sensor Array

    Gupta, V., Khandelwal, S., Panunzi, G., Martinelli, E., Hamdioui, S., Jabir, A. & Ottavi, M., 2020, 2020 IEEE 26th International Symposium on On-Line Testing and Robust System Design (IOLTS): Proceedings. IEEE, p. 1-2 2 p. 9159727

    Research output: Chapter in Book/Conference proceedings/Edited volume › Conference contribution › Scientific › peer-review

    1 Citation (Scopus)
  • 2019

    A Computation-In-Memory Accelerator Based on Resistive Devices

    Du Nguyen, H. A., Yu, J., Abu Lebdeh, M., Taouil, M. & Hamdioui, S., 2019, Proceedings of the International Symposium on Memory Systems. New York: Association for Computing Machinery (ACM), p. 19-32 14 p. (ICPS: ACM International Conference Proceeding Series).

    Research output: Chapter in Book/Conference proceedings/Edited volume › Conference contribution › Scientific › peer-review

    2 Citations (Scopus)
    2 Downloads (Pure)

  • Applications of Computation-In-Memory Architectures based on Memristive Devices

    Hamdioui, S., Du Nguyen, H. A., Taouil, M., Sebastian, A., Le Gallo, M., Pande, S., Schaafsma, S., Catthoor, F., Das, S., G. Redondo, F., Karunaratne, G., Rahimi, A. & Benini, L., 2019, Proceedings of the 2019 Design, Automation and Test in Europe Conference and Exhibition, DATE 2019: Proceedings. IEEE, p. 486-491 6 p. 8715020

    Research output: Chapter in Book/Conference proceedings/Edited volume › Conference contribution › Scientific › peer-review

    Open Access
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    33 Citations (Scopus)
    1001 Downloads (Pure)

  • CIM-SIM: Computation in Memory SIMuIator

    Banagozar, A., Vadivel, K., Stuijk, S., Corporaal, H., Wong, S., Lebdeh, M. A., Yu, J. & Hamdioui, S., 27 May 2019, SCOPES'19: Proceedings of the 22nd International Workshop on Software and Compilers for Embedded Systems. Stuijk, S. (ed.). New York, NY: Association for Computing Machinery (ACM), p. 1-4 4 p.

    Research output: Chapter in Book/Conference proceedings/Edited volume › Conference contribution › Scientific › peer-review

    15 Citations (Scopus)

  • Device-Aware Test: A New Test Approach Towards DPPB Level

    Fieback, M., Wu, L., Cardoso Medeiros, G., Aziza, H., Rao, S., Marinissen, E. J., Taouil, M. & Hamdioui, S., 9 Nov 2019, 2019 IEEE International Test Conference, ITC 2019. IEEE, 10 p. 9000134. (Proceedings - International Test Conference; vol. 2019-November).

    Research output: Chapter in Book/Conference proceedings/Edited volume › Conference contribution › Scientific › peer-review

    Open Access
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    38 Citations (Scopus)
    139 Downloads (Pure)

  • DFT Scheme for Hard-to-Detect Faults in FinFET SRAMs

    Cardoso Medeiros, G., Taouil, M., Fieback, M., Bolzani Poehls, L. M. & Hamdioui, S., 2019, Proceedings - 2019 IEEE European Test Symposium, ETS 2019: Proceedings. IEEE, Vol. 2019-May. p. 1-2 2 p. 8791517

    Research output: Chapter in Book/Conference proceedings/Edited volume › Conference contribution › Scientific › peer-review

    Open Access
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    8 Citations (Scopus)
    214 Downloads (Pure)